VUFF

1. High-Intensity Facility

Specific device description Potencial for use (specific activities) Tariff for use of device* (Eur per hour)

The facility consists of:
1) Pharos Light Conversion femtosecond Yb:KGW oscillator with amplifier
6W average power diode-pumped high repetition rate femtosecond Yb:KGW laser. Maximum repetition rate is 200 kHz. Central wavelength 1030 nm, pulse duration 300 fs.
2) Dazzler acousto-optic modulator for spectral phase and amplitude programming of ultrafast laser pulses.
Parameters: instantaneous spectral range is 650 nm - 1100 nm, the resolution is (at λ = 800 nm) ≤ 0.5 nm.
3) Picosecond high average power amplifier
Properties: central wavelength is 1064 nm, pulse repetition frequency - 1 kHz and the pulse duration is 75 ± 6 ps. The amplifier has three “top-hat” spatial profile outputs. ≥8 mJ energy pulses can be generated in one of them. The other two allow for energy pulses of ≥30mJ.
4) Femtosecond parametric amplifier
Properties: spectral range is 670 - 950 nm, pulse energy ≥30 μJ.
5) The high average power picosecond pulse parametric amplification system
Properties: spectral range is from 700 nm to 1000 nm, pulse energy ≥5 mJ pulse duration ≤10 fs.
6) Amplitude technologies femtosecond laser pulses contrast meter
Spectral range is 760-840 nm, temporal range 500 ps, dynamic range 1010, and minimal impulse energy 100 μJ.
7) Unique laboratory set of high-intensity diagnostic equipment.

I. Femtosecond laser pulse source for parametric amplifier pumping and investigation of nonlinear optical processes.
II. Ultrashort pulse seed source for further laser radiation power increase, expansion of spectral range of generated pulses, research of registration methods.
III. Femtosecond laser pulses (at 800 nm) contrast measurement.

92.83

33 didel intens ii

* Price without VAT and accounts only equipment rental costs (excluding staff contribution)

2. XUV detection set

Specific device description Potencial for use (specific activities) Tariff for use of device* (Eur per hour)

The set consists of:
1) XUV detection and registration system
Spectral range is 1-310 nm, resolution 0.1 nm.
2) Vacuum chamber with a pump
Inner chamber dimensions are 610 × 810x175 mm. The pressure is maintained in the 1x10-7 - 1000 mbar range.

Detection of 1-320 nm spectral range radiation

48.55

* Price without VAT and accounts only equipment rental costs (excluding staff contribution) 

3. Andor Technology imaging spectrograph Shamrock SR-500i for broad spectral range and CCD camera iXon+ -885

Specific device description Potencial for use (specific activities) Tariff for use of device* (Eur per hour)

The spectrograph has two sets of three optical gratings. Spectral range: 150 – 30.000 nm, resolution 0.1 nm in the visible spectral range.
CCD camera spectral range: 400-1100 nm.

Spectral characteristic study of lasers, optical parametric generators and laser-created plasma.

 18.09

* Price without VAT and accounts only equipment rental costs (excluding staff contribution)

4. NIR fiber optic spectrograph AvaSpec-NIR256-2.5

Specific device description Tariff for use of device* (Eur per hour)

 InGaAs detector, spectral range: 1000-2500 nm.

 16.18

* Price without VAT and accounts only equipment rental costs (excluding staff contribution)

5. Olympus BX51 optical microscope, Qimaging CCD camera microPublisher 5.0

Specific device description Potencial for use (specific activities) Tariff for use of device* (Eur per hour)

UIS2 optical system, three objectives of 10, 20 and 40 times magnification, focusing: vertical table travel 25 mm.
Observation methods: brightfield, darkfield, phase contrast Nomarski differential interference contrast.

For different sample morphology observation and image registration.

 16.53

* Price without VAT and accounts only equipment rental costs (excluding staff contribution)

6. Aerotech mid-motion five-coordinate precision positioning module with unique set of equipment and diagnostics and Light Conversion Pharos femtosecond Yb:KGW laser

Specific device description Potencial for use (specific activities) Tariff for use of device* (Eur per hour)

Technical parameters of the positioning system:
1)X and Y axis (ANT180-160-L): maximum motion is 160 mm, speed 350 mm/s, accuracy 300 nm.
2) Z axis (ANT130-060-L): maximum motion is 60 mm, speed 350 mm, accuracy 200 nm.
Rotating axes technical parameters:
1) ADRS-150: rotating part diameter is 140 mm, accuracy ± 6 arc sec, resolution 0.315-31.5 μrad.
2) ANT130-360-R: ±360° rotation angle, accuracy ±10 arc sec; maximum speed 200 rps.
The system is assembled on a granite plate with control electronics. Software for the 5-axis positioning system management is installed. The subsystem for beam management of 10 m/s positioning velocity and 1.5 m/s marking speed and the system for focusing the beam on the sample with a 150 mm focal length for 1030/515/343 nm wavelength radiation are also integrated. The positioning system is used with the 6W average power diode-pumped high repetition rate femtosecond Yb:KGW laser. The maximum repetition rate of the laser is 200 kHz, central wavelength is 1030 nm and pulse duration 320 fs.

Microfabrication, investigation of femtosecond laser radiation and material interaction.  42.14

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* Price without VAT and accounts only equipment rental costs (excluding staff contribution)

7. Ultrafast spectroscopy facility

Specific device description Potencial for use (specific activities) Tariff for use of device* (Eur per hour)

The equipment set consists of:
1) Regenerative Ti:Sapphire amplifier of femtosecond pulses with Libra-USP-HE 30W solid-state pump laser and a unique set of spectroscopy equipment and diagnostics.
Central wavelength of the amplified pulses is 800 nm, maximum pulse repetition rate 1 kHz, pulse duration < 50 fs. Pulse energy at 1 kHz repetition rate is > 3.5 mJ. There is a switchover option between 505 fs pulse and 11010 fs pulse amplification modes.
2) Light Conversion parametric generator TOPAS-800 (2 units).
Both are pumped by the first harmonic of Ti: sapphire amplifier. Spectral range: 1150 - 2600 nm. One of them allows for using the difference frequency method for expansion of the spectral range: 100 nm - 20 mm. 

For ultrafast spectroscopy, investigation of nonlinear optical interactions, laser radiation and materials interactions.

61.3

Pav2 3

* Price without VAT and accounts only equipment rental costs (excluding staff contribution)

8. Sensofar PLμ2300 optical profilometer

Specific device description Potencial for use (specific activities) Tariff for use of device* (Eur per hour)

5 objectives: Nikon 10x/0.30 DI , Nikon Lu Plan 10x/0.30 A, Nikon Lu Plan 20x/0.45, Lu Plan 100x/0.9, Nikon Lu Plan 50 x 0.8 A
Maximum table travel:
x ~115 mm, y ~ 75 mm, z ~ 35 mm.

For topographic analysis of different sample surfaces.

19.31

* Price without VAT and accounts only equipment rental costs (excluding staff contribution)

9. Hitachi TM-1000 tabletop electron microscope

Specific device description Potencial for use (specific activities) Tariff for use of device* (Eur per hour)

Maximum magnification 10000, maximum sample size 70 mm in diameter, maximum sample height 20 mm, detector – backscattered electron detector (BSE). Maximum magnification 10000, maximum sample size 70 mm in diameter, maximum sample height 20 mm, detector – backscattered electron detector (BSE). 

For different sample morphology observation.

19.54

* Price without VAT and accounts only equipment rental costs (excluding staff contribution)

10. Facility for ultrashort pulse research

Specific device description Potencial for use (specific activities) Tariff for use of device* (Eur per hour)

The facility consists of:
I. Spectra Physics Ti:saphire femtosecond system with non-collinear parametric amplifier and ultrashort pulse IR radiation source
Central wavelength of the amplified pulses is 800 nm, maximum pulse repetition rate 1 kHz, pulse duration 130 fs. Pulse energy at 1kHz repetition rate is 3 mJ. Non-collinear parametric amplifier generates <20 fs radiation in the 550-750 nm spectral range. The ultrashort pulse IR source generates < 20 fs pulses in 2 m range.
II. Diagnostic complex, which consists of:
High dynamic range Andor CCD camera, Grenouille pulse duration meter and a unique set of diagnostics for space-time and spectral characteristics.
With this set, the spatial distribution of radiation in the 300-1100 nm spectral range can be recorded. Pulse duration in visible and IR spectral range and spectral characteristics in 200-2500 nm can be measured.

For analysis of ultrashort pulse and light beam self-action processes in transparent materials.

53.25

* Price without VAT and accounts only equipment rental costs (excluding staff contribution)

11. Light Conversion Pharos femtosecond laser system

Specific device description Potencial for use (specific activities) Tariff for use of device* (Eur per hour)

6W average power diode-pumped high repetition rate femtosecond Yb:KGW laser. Maximum repetition rate is 200 kHz. Central wavelength 1030 nm, pulse duration 300 fs, pulse energy to 0.4 mJ. 

For nanophotonic research:
1. Numerical modeling, laser formation, geometry and optical properties (focus, collimation, phase modulation) description of multifunctional (refractive / diffractive) and integrated (on the optical fiber tip) micro – optical elements (10 – 100 μm).
2. Artificial three-dimensional frame laser formation for cell biology and tissue engineering applications. Biologically inert and degrading polymers can be used, and a carcass can be produced made of several different materials. Pore size and filling factor can be varied from 1 to 100 μm and 20-80%, respectively.
3. Laser formation of nanophotonic elements in polymers and transparent material. The laser can be used to form two-dimensional and three-dimensional fixed and gradually variable period photonic crystals. Their period can be from 0.5 to 10 μm. Numerical modeling of these items and characterization of their light control properties.

45.51

* Price without VAT and accounts only equipment rental costs (excluding staff contribution)

12. Shimadzu UV-3101PC spectrophotometer

Specific device description Potencial for use (specific activities) Tariff for use of device* (Eur per hour)

Spectral range: 190-3200 nm, resolution 0.1 nm.
Slit width: : 0.1; 0.2 ;0.5; 1 ;2 ;3 ;5 ;8; 12; 20; 30 nm
Wavelength scanning speed:
a) fast: 1600 nm/min (with 2 nm/min sampling interval)
b) middle: 200 nm/min (with 0,5 nm/min sampling interval)
c) slow: 100 mm/min
d) very slow: 50 mm/min.

Measurement of various optical samples spectral characteristics (transmission, absorption, reflection).

18.27

spektrofotom

* Price without VAT and accounts only equipment rental costs (excluding staff contribution)

13. Femtosecond Ti:sapphire laser complex

Specific device description Potencial for use (specific activities) Tariff for use of device* (Eur per hour)

Potential for use (specific activities) Tariff for use of device (Eur per h)*
The set consists of:
1) Femtosecond Ti:sapphire laser system.
The system generates radiation of 800 nm central wavelength. Pulse energy at 1kHz repetition rate is 10 mJ. Duration of pulse is ̴ 40 fs.
2) Tunable parametric amplifiers for visible and IR spectral range.
Spectral range of radiation is from 235nm to 9000 nm. Maximum sum energy of signal and idler pulse is >3000 μJ at 1500 nm wavelength,
3) Femtosecond pulse duration meter APE PulseCheck 15 ShortPulse.
20 - 1000 fs laser pulse duration can be measured in the spectral range from 410 to 2000 nm, using variable optical sets. 20-50 fs duration pulses can be measured with the FROG technique in the 700-900 nm spectral range.
4) Unique set of equipment and diagnostics.

Studies of laser radiation and matter interaction, research of nonlinear optical processes, generation of THz radiation, laser damage threshold tests and testing of commercial non-linear optical devices. 

89.8

* Price without VAT and accounts only equipment rental costs (excluding staff contribution)